yieldWerx and iTest Form Strategic Collaboration to Deliver Integrated Test Data Intelligence
By embedding enterprise-grade analytics directly within iTest’s production testing workflow, semiconductor customers gain real-time insights, faster yield learning, and accelerated time-to-market.
yieldWerx, a leading provider of end-to-end semiconductor test data and yield analytics, announced a strategic collaboration with iTest, a premier independent IC testing laboratory based in Silicon Valley. This partnership integrates yieldWerx's enterprise-grade analytics platform directly into iTest's production environment, enabling customers to access advanced data visualization, AI-powered analytics, and automated workflows—right from within the test lab, eliminating the need for complex integrations or data transfers.
The collaboration bridges a long-standing gap between test execution and data intelligence. By combining iTest's high-performance testing capabilities with yieldWerx's unified analytics engine, semiconductor customers will benefit from:
- Real-Time Insights at the Source: Access dashboards, correlation analytics, and SPC control directly within iTest's secure lab environment.
- Accelerated Engineering Feedback: Automated lot dispositioning and outlier detection speed up yield learning and process optimization.
- Remote Data Access & Collaboration: Engineers can securely access test data from their offices to support product engineering and test program development.
- Faster Time-to-Market: Enterprise-grade analytics that once took months to implement are now available within days.
- Enhanced Collaboration & Transparency: OEMs, fabless companies, and foundries gain shared visibility across data silos, improving decision-making and accountability.
- Upskilling Opportunities: iTest customers can leverage industry-standard tools and methodologies, reducing the need to reinvent analytics processes.
